July 17, 2025 – August 1, 2025
A Pd thin film on a silicon chip was loaded as received from Mastromatteo into a chamber pressurized with deuterium gas at 0.50 bar above atmospheric pressure. We then illuminated the chip with 1.14 mW of 633 nm light from a HeNe laser, with the spot expanded to 8.9 mm diameter to cover the whole sample. The laser illumination ran continuously for two weeks.
No thermal or radioactive anomalies were detected.
[RESULTS OF SURFACE VIEWER/CR-39 ANALYSIS]
- Data panels
- [SEM prescan]
- [Optical postscan]
- [PSD analysis on github]
- [Radiation analysis on github]
- [Lab Notebook]